Test Structure Design of "Longtium" S2 Micro-Processor

CHEN Chao; WANG Dang-hui; ZHANG Sheng-bing; WANG De-li

Chinese

您当前的位置：

首页 >

文章列表页 >

Test Structure Design of "Longtium" S2 Micro-Processor

更新时间：2026-09-04

- Test Structure Design of "Longtium" S2 Micro-Processor
- Vol. 27, Issue 1, Pages: 109-112(2010)
- 作者机构：
  
  西北工业大学计算机学院,陕西,西安,710072
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2010
- 稿件说明：
移动端阅览
陈超, 王党辉, 张盛兵, 王得利. “龙腾”S2微处理器测试结构设计[J]. 微电子学与计算机, 2010, 27(1): 109-112.

CHEN Chao, WANG Dang-hui, ZHANG Sheng-bing, et al. Test Structure Design of "Longtium" S2 Micro-Processor[J]. 2010, 27(1): 109-112.
陈超, 王党辉, 张盛兵, 王得利. “龙腾”S2微处理器测试结构设计[J]. 微电子学与计算机, 2010, 27(1): 109-112. DOI：

CHEN Chao, WANG Dang-hui, ZHANG Sheng-bing, et al. Test Structure Design of "Longtium" S2 Micro-Processor[J]. 2010, 27(1): 109-112. DOI：

摘要

介绍了“龙腾”S2微处理器测试结构设计方法

详细讨论了采用全扫描测试、内建自测试 (BIST) 等可测性设计 (DFT) 技术.该处理器与PC104全兼容

设计中的所有寄存器采用全扫描结构

设计中的存储器采用内建自测试

整个设计使用JTAG作为测试接口.通过这些可测性设计

使芯片的故障覆盖率达到了100%

能够满足流片后测试需求.

Abstract

This paper presents the test architecture of "Longtium" S2 micro-processor

adopted full scan test

Built-In Self Test (BIST) etc.Design For Test (DFT) .The processor is full compatible with PC104

In our design

all registers was structured by full scan

all memories were applied with BIST

whole design used JTAG for test interface.All those made faults coverage of the chip to come to 100%.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

3D-SIC built-in self-test scheme based on cross-layer reconfigurable LFSR

A high-efficiency charge pump for ultra-low voltage boost systems

Simulation on the DC characteristics of double heterojunction p-GaN HEMT with AlN/GaN hybrid buffer layer

Monte carlo analysis of V-layout trench SiC neutron detector

High gain stability high temperature operational amplifier based on reverse body bias

Related Author

CHEN Tian

LUO Beibei

LIU Jun

LU Yingchun

Related Institution

School of Computer and Information, Hefei University of Technology

Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine, Hefei University of Technology

School of Microelectronics, Hefei University of Technology

AI问答

Postal code：100079
Tel：（010）53879206 Email：tmw@bjxintong.com.cn
Technical support is provided by Beijing Founder electronics co., LTD 京ICP备09082226号-64 京公网安备11010602201714号
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰