Testability Analysis for Complex Circuit Board Based on Fault Simulation and Rough Set

WANG Cheng-gang; ZHOU Xiao-dong; WANG Xue-wei

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Testability Analysis for Complex Circuit Board Based on Fault Simulation and Rough Set

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- Testability Analysis for Complex Circuit Board Based on Fault Simulation and Rough Set
- Vol. 27, Issue 1, Pages: 131-134(2010)
- 作者机构：
  
  海军航空工程学院,山东,烟台,264001
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2010
- 稿件说明：
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王成刚, 周晓东, 王学伟. 基于故障仿真和粗糙集的复杂电路板测试性分析[J]. 微电子学与计算机, 2010, 27(1): 131-134.

WANG Cheng-gang, ZHOU Xiao-dong, WANG Xue-wei. Testability Analysis for Complex Circuit Board Based on Fault Simulation and Rough Set[J]. 2010, 27(1): 131-134.
王成刚, 周晓东, 王学伟. 基于故障仿真和粗糙集的复杂电路板测试性分析[J]. 微电子学与计算机, 2010, 27(1): 131-134. DOI：

WANG Cheng-gang, ZHOU Xiao-dong, WANG Xue-wei. Testability Analysis for Complex Circuit Board Based on Fault Simulation and Rough Set[J]. 2010, 27(1): 131-134. DOI：

摘要

针对关联模型在复杂电路板测试性分析中对不确定问题描述与分析的缺陷

提出了基于故障仿真和粗糙集的测试性分析方法.通过故障仿真生成条件属性集

利用粗糙集将其约简

最终形成分辨矩阵

从而评价电路的测试性水平.最后通过实例分析验证了方法的有效性.

Abstract

Aiming at the limitation of dependency model in description and analysis of uncertain problem for testability analysis of complex circuit board

a testability analysis method is put forward based on fault simulation and rough set.Firstly

condition attributes are generated through fault simulation.Then

discernibility matrix is provided by rough set reduction.And moreover

the fault detection rate and fault isolation rate of circuit board can be calculated based on the matrix.Finally

an example proves that our method is feasible and effective.

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