Scan Chain Partition New Approach Considering Test Power Reduction

WANG Guan-jun; ZHAO Ying; WANG Mao-li

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Scan Chain Partition New Approach Considering Test Power Reduction

更新时间：2026-09-04

- Scan Chain Partition New Approach Considering Test Power Reduction
- Vol. 27, Issue 1, Pages: 144-146(2010)
- 作者机构：
  
  1. 中国矿业大学计算机科学与技术学院,江苏,徐州,221116
  2. 山东省计算中心机构,山东,济南,250014
- 作者简介：
- 基金信息：
- DOI：
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- Published：2010
- 稿件说明：
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王冠军, 赵莹, 王茂励. 考虑测试功耗的扫描链划分新方法[J]. 微电子学与计算机, 2010, 27(1): 144-146,150.

WANG Guan-jun, ZHAO Ying, WANG Mao-li. Scan Chain Partition New Approach Considering Test Power Reduction[J]. 2010, 27(1): 144-146.
王冠军, 赵莹, 王茂励. 考虑测试功耗的扫描链划分新方法[J]. 微电子学与计算机, 2010, 27(1): 144-146,150. DOI：

WANG Guan-jun, ZHAO Ying, WANG Mao-li. Scan Chain Partition New Approach Considering Test Power Reduction[J]. 2010, 27(1): 144-146. DOI：

摘要

提出考虑测试功耗的扫描链划分新方法.首先为基于扫描设计电路的峰值测试功耗和平均功耗建模

得出测试功耗主要由内部节点的翻转引起的结论

因此考虑多条扫描链情况

从输入测试集中寻找相容测试单元

利用扫描单元的兼容性

并考虑布局信息

将其分配到不同的扫描链中共享测试输入向量

多扫描链的划分应用图论方法.在ISCAS89平台上的实验结果表明

有效降低了峰值测试功耗和平均测试功耗.

Abstract

A novel scan chain partition approach considering test power is presented.The peak test power and average test power of scan-based design circuits is modeled firstly

then the conclusion of test power are produced by the switching activity is obtained

considering the situation of multi-chain

to search the compatible cell from the input test set and make use of the compatibility of the scan cells

considering the layout information

distribute the scan cells to different scan chains

the multi-chain partition approach is based on Graph theory.The experiments on ISCAS89 benchmark show our approachs efficiency.The average test power and peak test power are reduced dramatically.

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