The Design of Wrapper and Fault Test For SoC Mememory

TAN En-min; MA Jiang-bo; QIN Chang-ming

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The Design of Wrapper and Fault Test For SoC Mememory

更新时间：2026-09-04

- The Design of Wrapper and Fault Test For SoC Mememory
- Vol. 28, Issue 6, Pages: 122-125(2011)
- 作者机构：
  
  桂林电子科技大学机构电子工程与自动化学院,广西,桂林,541004
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2011
- 稿件说明：
移动端阅览
谈恩民, 马江波, 秦昌明. SoC的存储器Wrapper设计及故障测试[J]. 微电子学与计算机, 2011, 28(6): 122-125.

TAN En-min, MA Jiang-bo, QIN Chang-ming. The Design of Wrapper and Fault Test For SoC Mememory[J]. 2011, 28(6): 122-125.
谈恩民, 马江波, 秦昌明. SoC的存储器Wrapper设计及故障测试[J]. 微电子学与计算机, 2011, 28(6): 122-125. DOI：

TAN En-min, MA Jiang-bo, QIN Chang-ming. The Design of Wrapper and Fault Test For SoC Mememory[J]. 2011, 28(6): 122-125. DOI：

摘要

在系统芯片SoC测试中

存储器的可靠性测试是一项非常重要内容.IEEE Std 1500是专门针对嵌入式芯核测试所制定的国际标准

规范了IP核提供者和使用者之间的标准接口.基于此标准完成针对SoC存储器的Wrapper测试壳结构和控制器的设计.以32×8的SRAM为测试对象进行测试验证.结果表明

系统能够准确的诊断出存储器存在故障.

Abstract

In the testing of system on chips(SoC)

the reliability testing for the memory is very important.The IEEE Std 1500 is a international standard that is specially instituted for embedded core testing

it establishes the standard interface between the providers and users of the IP cores.The design for the Wrapper architecture and controller of the SoC memory is based on the IEEE Std 1500.This paper validates the SRAM as the test object.And the results indicate that the system can diagnose the faults in the memory accurately.

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