Research on Design for Testability of Mixed-Signal Circuits Based on Relevance Model

WANG Jin-yang; CHEN Sheng-jian; ZHANG Sheng-man; SONG Ke-ling

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Research on Design for Testability of Mixed-Signal Circuits Based on Relevance Model

更新时间：2026-09-04

- Research on Design for Testability of Mixed-Signal Circuits Based on Relevance Model
- Vol. 28, Issue 2, Pages: 157-161(2011)
- 作者机构：
  
  1. 1 装甲兵工程学院控制工程系,北京,100072
  2. 2 总装备部63963部队,北京,100072
  3. 3 总装备部63956部队,北京,100093
  4. 4 北京969信箱, 55分箱,北京,100072
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2011
- 稿件说明：
移动端阅览
王晋阳, 陈圣俭, 张胜满, 宋克岭. 基于相关性模型的混合电路系统测试性设计研究[J]. 微电子学与计算机, 2011, 28(2): 157-161.

WANG Jin-yang, CHEN Sheng-jian, ZHANG Sheng-man, et al. Research on Design for Testability of Mixed-Signal Circuits Based on Relevance Model[J]. 2011, 28(2): 157-161.
王晋阳, 陈圣俭, 张胜满, 宋克岭. 基于相关性模型的混合电路系统测试性设计研究[J]. 微电子学与计算机, 2011, 28(2): 157-161. DOI：

WANG Jin-yang, CHEN Sheng-jian, ZHANG Sheng-man, et al. Research on Design for Testability of Mixed-Signal Circuits Based on Relevance Model[J]. 2011, 28(2): 157-161. DOI：

摘要

1针对测试性设计要求

基于IEEE1149.4标准

利用相关性模型对某控制盒的混合电路系统进行测试性分析与建模

建立被测系统各组成单元与边界扫描测试之间的相关性矩阵

得到优化的边界扫描器件置换与边界扫描结构置入方法.通过制定相应的诊断策略

给出一种通用的混合信号电子系统BIT设计方案.系统验证实验表明

该方法测试迅速

可以有效地提高电子系统测试性.

Abstract

In view of the requirement of design for testability

based on the IEEE Std 1149.4

a optimize method of the replacement and interposition of boundary scan components is proposed by using the relevance model to analyze and make modeling for a mixed-signal system

and building the dependency matrix between the parts of the circuits and the boundary scan test. A universal design of BIT is presented by making the corresponding diagnostic strategy. The verifying experiment of system indicates that the optimize method can make test rapidly and promote the testability of electronic system efficaciously.

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