A Program-Controlled Method for Memory BIST

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A Program-Controlled Method for Memory BIST

更新时间：2026-09-04

- A Program-Controlled Method for Memory BIST
- Vol. 28, Issue 3, Pages: 182-185(2011)
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- Published：2011
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存储器内建自测试的程序控制方法[J]. 微电子学与计算机, 2011, 28(3): 182-185.

A Program-Controlled Method for Memory BIST[J]. 2011, 28(3): 182-185.
存储器内建自测试的程序控制方法[J]. 微电子学与计算机, 2011, 28(3): 182-185. DOI：

A Program-Controlled Method for Memory BIST[J]. 2011, 28(3): 182-185. DOI：

摘要

文中提出了一种利用处理器的指令系统编写特定程序

通过程序运行来控制完成整个存储器内建自测试过程的方法.基于此方法的设计已经成功应用于一款处理器中

有效地提高了芯片的可测试性和应用系统的容错性.

Abstract

In this article

we opened a kind of novel method.Differed from the current methods which use I/O pins of a processor

this mehtod used the system instruction of a processor to design the special program

which controls the whole process of memory BIST.This method effectively enhanced the testability of the chip and the fault tolerability of an application system

and it has been used in a real chip successfully.

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