Design for Testability of Digital Cores Based on Wrapper and TAM

CHEN Sheng-jian; LI Guang-jin; GAO Hua

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Design for Testability of Digital Cores Based on Wrapper and TAM

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- Design for Testability of Digital Cores Based on Wrapper and TAM
- Vol. 29, Issue 6, Pages: 42-45(2012)
- 作者机构：
  
  装甲兵工程学院控制工程系,北京,100072
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2012
- 稿件说明：
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陈圣俭, 李广进, 高华. 基于外壳架构与测试访问机制的数字芯核可测试性设计[J]. 微电子学与计算机, 2012, 29(6): 42-45,50.

CHEN Sheng-jian, LI Guang-jin, GAO Hua. Design for Testability of Digital Cores Based on Wrapper and TAM[J]. 2012, 29(6): 42-45.
陈圣俭, 李广进, 高华. 基于外壳架构与测试访问机制的数字芯核可测试性设计[J]. 微电子学与计算机, 2012, 29(6): 42-45,50. DOI：

CHEN Sheng-jian, LI Guang-jin, GAO Hua. Design for Testability of Digital Cores Based on Wrapper and TAM[J]. 2012, 29(6): 42-45. DOI：

摘要

深亚徽米技术的应用以及芯核的嵌入性特点.使传统的测试方法不再能满足芯核测试的需要.IEEEStdl 500针对此问题提出了芯核的可测试性设计方案——外壳架构和测试访问机制.基于IEEE Stdl 500.以74373与741 38软梭为例

提出数字芯梭可测试性设计的方法

并通过多种指令仿真验证了设计的合理性;设计的TAM控制器复用JTAC-端口

节约了测试端口资源.提供了测试效率.

Abstract

Because of the development of deep submicron manufacture technology and embeddability of cores. conventional methods cannot apply to cores.To solve this problem

a novel test method which consists of wrapper architecture and test access mechanism is presented by IEEE Std1500.Taking 74373 and 74138 for example

the design process which is based on IEEE Std1500 is described in detail.Through of multi-instruction simulation

the designs validity is proved.

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