Research on IEEE Std1500 Wrapper Design for Digit IP Core

LI Guang-jin; CHEN Sheng-jian; NIU Jin-tao; GAO Hua

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Research on IEEE Std1500 Wrapper Design for Digit IP Core

更新时间：2026-09-04

- Research on IEEE Std1500 Wrapper Design for Digit IP Core
- Vol. 29, Issue 10, Pages: 42-46(2012)
- 作者机构：
  
  1. 装甲兵工程学院控制工程系,北京,100072
  2. 北京军区司令部,北京,100144
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2012
- 稿件说明：
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李广进, 陈圣俭, 牛金涛, 高华. 数字IP核的IEEE Std1500外壳架构设计研究[J]. 微电子学与计算机, 2012, 29(10): 42-46.

LI Guang-jin, CHEN Sheng-jian, NIU Jin-tao, et al. Research on IEEE Std1500 Wrapper Design for Digit IP Core[J]. 2012, 29(10): 42-46.
李广进, 陈圣俭, 牛金涛, 高华. 数字IP核的IEEE Std1500外壳架构设计研究[J]. 微电子学与计算机, 2012, 29(10): 42-46. DOI：

LI Guang-jin, CHEN Sheng-jian, NIU Jin-tao, et al. Research on IEEE Std1500 Wrapper Design for Digit IP Core[J]. 2012, 29(10): 42-46. DOI：

摘要

IP核可测试性架构的多样性、互不兼容性给SoC的测试带来不便

IEEE Std1500针对此问题提出了一种标准的、可配置的可测试性架构

如何设计实现这种架构便成为SoC测试研究的热点问题.基于IEEE Std1500

利用边界扫描技术

结合自行设计的IP核

本文给出标准化架构的设计过程

利用quartus ii平台仿真验证了多种测试指令下设计的有效性.提出的外壳并行配置设计打破传统串行测试的局限性

为实现SoC中IP核的并行测试、缩短测试时间提供新的思路.

Abstract

Because of the diversity of IP-core testability structure

the test of SoC is becoming more and more difficult.Aiming at this

a standardized structure is proposed by IEEE Std1500

how to realize this structure becomes a research of interest.Based on IEEE Std1500 and boundary-scan

taking user-designed IP core for example

one design method of the structure is discussed;By using quartus ii

multi-instruction simulation of structure is done

and the designs validity is proved.Through the design of WPP

a novel method to accomplish parallel test of IP-core is put forward.

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