An Event-driven QoS Routing Protocol for Heterogeneous Sensor Work

WAN Xiao-xia; TIAN Ming; WU Guo-min

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An Event-driven QoS Routing Protocol for Heterogeneous Sensor Work

更新时间：2026-09-04

- An Event-driven QoS Routing Protocol for Heterogeneous Sensor Work
- Vol. 29, Issue 9, Pages: 59-62(2012)
- 作者机构：
  
  1. 盐城师范学院机构信息学院,江苏,盐城,224003
  2. 南京航空航天大学计算机学院,江苏,南京,210005
  3. 盐城工学院机构信息学院,江苏,盐城,224051
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2012
- 稿件说明：
移动端阅览
万小霞, 田明, 吴国民. 基于事件驱动的QoS异构传感器网络路由协议[J]. 微电子学与计算机, 2012, 29(9): 59-62.

WAN Xiao-xia, TIAN Ming, WU Guo-min. An Event-driven QoS Routing Protocol for Heterogeneous Sensor Work[J]. 2012, 29(9): 59-62.
万小霞, 田明, 吴国民. 基于事件驱动的QoS异构传感器网络路由协议[J]. 微电子学与计算机, 2012, 29(9): 59-62. DOI：

WAN Xiao-xia, TIAN Ming, WU Guo-min. An Event-driven QoS Routing Protocol for Heterogeneous Sensor Work[J]. 2012, 29(9): 59-62. DOI：

摘要

针对异构传感器网络中的突发事件

文中提出的一种QoS路由协议 (EQHR) .EQHR路由协议主要由三个阶段组成:在网络初始化阶段

每个节点配置自身的路由表.在路径发现与建立阶段

当前节点寻找多条不相交路径中综合代价最小的路径.在数据通信与路径维护阶段

利用ACK确认机制来处理路径选择失败的问题.仿真结果表明

在相等数据发送率的前提下

EQHR路由协议比MM Speed、AODV协议在数据传输成功率、数据延时、网络剩余能量方面均有不同程度的提高.

Abstract

As to some disruptive events in the heterogeneous sensor network

a QoS routing protocol is proposed (EQHR) .EQHR protocol consists of three phrases: In the first phrase

every node gets initial route table.In the second phrase

source node will find minimum-cost path among multiple disjoint paths.In the third phrase

data transmission and route maintenance are conducted for failure of route selection under the ACK confirmation mechanism.Simulation result shows that EQHR protocol can make some improvements for the ratio of successful data delivery

data delay and network residual energy

compared to MM Speed

or AODV protocol.

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Related Author

WAN Xiao-xia

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WU Guo-min

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ZHONG Mingchen

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YU Shan

SHAN Shushan

Related Institution

盐城师范学院机构网络工程系

南京航空航天大学计算机学院

盐城工学院机构计算机工程系

State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology,Beijing Smart-Chip Microeletronics Technology Co., Ltd.

Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microeletronics Technology Co., Ltd.

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