Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

LI Wen-chang; WAN Li; RUAN Ai-wu; YU Dun-shan

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Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

更新时间：2026-09-04

- Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs
- Vol. 31, Issue 1, Pages: 5-7(2014)
- 作者机构：
  
  1. 1 北京大学信息科学技术学院,北京,100871
  2. 2 电子科技大学电子薄膜与集成器件国家重点实验室机构,四川,成都,610054
- 作者简介：
- 基金信息：
- DOI：
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- Published：2014
- 稿件说明：
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李文昌, 万理, 阮爱武, 于敦山. 应用于Virtex系列FPGA的IR-CLB资源的联合测试和诊断[J]. 微电子学与计算机, 2014, 31(1): 5-7,12.

LI Wen-chang, WAN Li, RUAN Ai-wu, et al. Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs[J]. 2014, 31(1): 5-7.
李文昌, 万理, 阮爱武, 于敦山. 应用于Virtex系列FPGA的IR-CLB资源的联合测试和诊断[J]. 微电子学与计算机, 2014, 31(1): 5-7,12. DOI：

LI Wen-chang, WAN Li, RUAN Ai-wu, et al. Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs[J]. 2014, 31(1): 5-7. DOI：

摘要

FPGA （Field Programmable Gate Arrays）作为现场可编程门阵列，其丰富的内部资源和强大的功能越来越受到应用者的青睐.随着FPGA规模的增大，其可靠性问题日益受到重视.因此，如何保证FPGA可靠性成为了FPGA生产厂商和应用人员需要共同面对的问题.从FPGA的可靠性这一重要性出发，针对Virtex系列XCV300芯片的故障测试，根据互联资源的特点，创新性地提出了针对IR和CLB资源的IR-CLB资源联合测试方法.实现了IR和CLB资源的同时测试，并且利用FPGA底层布线工具得到了实际测试配置图形.

Abstract

The FPGA (Field Programmable Gate the Arrays)

as the most widely used programmable devices

are favored by more and more people due to their wealthy internal resources and good performance.However

the issue of FPGA reliability has received increasingly attention.A fault testing and diagnosis technique for both interconnect resources and CLBs in Virtex series FPGAs is presented in the paper.Experimental results demonstrate that the proposed testing and diagnosis method is applicable to the Virtex series FPGAs.

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