Optimization of SoC Test Multiple Objects Based on TAM Grouping Strategy

TAN En-min; LI Qing-qing

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Optimization of SoC Test Multiple Objects Based on TAM Grouping Strategy

更新时间：2026-09-04

- Optimization of SoC Test Multiple Objects Based on TAM Grouping Strategy
- Vol. 30, Issue 10, Pages: 69-72(2013)
- 作者机构：
  
  桂林电子科技大学机构电子工程与自动化学院,广西,桂林,541004
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2013
- 稿件说明：
移动端阅览
谈恩民, 李清清. 基于TAM分组策略的SoC测试多目标优化设计[J]. 微电子学与计算机, 2013, 30(10): 69-72.

TAN En-min, LI Qing-qing. Optimization of SoC Test Multiple Objects Based on TAM Grouping Strategy[J]. 2013, 30(10): 69-72.
谈恩民, 李清清. 基于TAM分组策略的SoC测试多目标优化设计[J]. 微电子学与计算机, 2013, 30(10): 69-72. DOI：

TAN En-min, LI Qing-qing. Optimization of SoC Test Multiple Objects Based on TAM Grouping Strategy[J]. 2013, 30(10): 69-72. DOI：

摘要

在片上系统芯片(System-on-Chip

SoC)测试优化技术的研究中

测试时间和测试功耗是相互影响相互制约的两个因素。在基于测试访问机制(Test Access Mechanism

TAM)分组策略的基础上

以测试时间和测试功耗为目标建立了联合优化模型

运用多目标遗传算法对模型进行求解。以ITC02标准电路中的p93791电路为实例进行验证

表明此方法能够在测试时间和测试功耗的优化上获得较理想的解

且能提高TAM通道的利用率。

Abstract

In the study of System-on-Chip (SoC) test optimization technology

test time and test power were mutual influence and restrict to each other. Based on TAM grouping strategy

this paper constructed the combined optimization model for test time and test power

applied multi-objective genetic algorithm to deal with the combined optimization model

and adopted ITC02 Benchmark circuit p93791 to verify the algorithm.The results show that it can obtain ideal solutions on optimization of test time and test power

and improve the utilization of TAM.

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