Built-in Self-test Design of the Embedded ROM and SRAM Based on the IEEE 1500 Standard

TAN Enmin; JIN Feng

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Built-in Self-test Design of the Embedded ROM and SRAM Based on the IEEE 1500 Standard

更新时间：2026-09-04

- Built-in Self-test Design of the Embedded ROM and SRAM Based on the IEEE 1500 Standard
- Vol. 30, Issue 7, Pages: 115-119(2013)
- 作者机构：
  
  桂林电子科技大学机构电子工程与自动化学院,广西,桂林,541004
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2013
- 稿件说明：
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谈恩民, 金锋. 基于IEEE1500标准的嵌入式ROM及SRAM内建自测试设计[J]. 微电子学与计算机, 2013, 30(7): 115-119.

TAN Enmin, JIN Feng. Built-in Self-test Design of the Embedded ROM and SRAM Based on the IEEE 1500 Standard[J]. 2013, 30(7): 115-119.
谈恩民, 金锋. 基于IEEE1500标准的嵌入式ROM及SRAM内建自测试设计[J]. 微电子学与计算机, 2013, 30(7): 115-119. DOI：

TAN Enmin, JIN Feng. Built-in Self-test Design of the Embedded ROM and SRAM Based on the IEEE 1500 Standard[J]. 2013, 30(7): 115-119. DOI：

摘要

嵌入式存储器在SOC中所占的面积比越来越大，同时也对嵌入式存储器测试技术提出了新的挑战.IEEE 1500标准为IP核设计商与集成商制订了标准的测试接口.基于此标准，本文完成了针对嵌入式存储器的测试外壳与具有兼容性的控制器的设计，以SRAM和ROM为测试对象进行验证，测试结果表明，该系统能准确地检测存储器存在的故障.

Abstract

Embedded memory in SOC occupied area ratio increasing

also presented new challenges for embedded memory test technology.IEEE 1500 standard for IP core providers and integrators to develop a standard test interface.This paper designs a test wrapper and compatibility controller for embedded memory.This paper validates the SRAM and ROM as test object.And the test results show that the system can accurately detect the existence of the fault of the embedded memory.

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