A New Static Test Method of a DAC with a Built-In Structure

CHENG Meng-zhang

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A New Static Test Method of a DAC with a Built-In Structure

更新时间：2026-09-04

- A New Static Test Method of a DAC with a Built-In Structure
- Vol. 30, Issue 10, Pages: 127-129(2013)
- 作者机构：
  
  华侨大学机构,福建,厦门,362021
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2013
- 稿件说明：
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程梦璋. 一种新颖的数模转换器静态参数内建自测试方法[J]. 微电子学与计算机, 2013, 30(10): 127-129,133.

CHENG Meng-zhang. A New Static Test Method of a DAC with a Built-In Structure[J]. 2013, 30(10): 127-129.
程梦璋. 一种新颖的数模转换器静态参数内建自测试方法[J]. 微电子学与计算机, 2013, 30(10): 127-129,133. DOI：

CHENG Meng-zhang. A New Static Test Method of a DAC with a Built-In Structure[J]. 2013, 30(10): 127-129. DOI：

摘要

提出了一种新颖的数模转换器(DAC)静态参数内建自测试(BIST)方法。该方法采用斜坡信号发生器和两个参考电压作为标准信号源和误差极限电压

测试DAC的四个主要的静态参数:失调误差(offset)

增益误差(gain error)

积分非线性误差(INL)和微分非线性误差(DNL)

有效地节省了参考源的数目。静态参数计算的优化以及测试器件的共享使得BIST电路所占芯片面积大大减小。仿真结果表明该方法是一种简单的测试DAC静态误差的内建自测试结构。

Abstract

A new BIST (Built-In Self-Test) method to test static parameters of a DAC (Digital to Analog Converter) is proposed in this paper.The BIST method employs a ramp generator and two voltage references to test static parameters of a DAC:offset error

gain error

INL (Integral Non-Linearity) and DNL (Differential Non-Linearity).The optimization of calculating static parameters and the components sharing can reduce the BIST circuitry.The simulation result shows that the method is able to detect the static errors with the simple BIST structure.

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