Efficient Sampling Control Circuit Design of Descriptors in SIFT

LI Qian; SANG Hong-shi; ZHANG Jing

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Efficient Sampling Control Circuit Design of Descriptors in SIFT

更新时间：2026-09-04

- Efficient Sampling Control Circuit Design of Descriptors in SIFT
- Vol. 31, Issue 9, Pages: 54-57(2014)
- 作者机构：
  
  华中科技大学图像识别与人工智能研究所,湖北,武汉,430074
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2014
- 稿件说明：
移动端阅览
李茜, 桑红石, 张静. SIFT描述子高效扫描控制电路结构设计[J]. 微电子学与计算机, 2014, 31(9): 54-57.

LI Qian, SANG Hong-shi, ZHANG Jing. Efficient Sampling Control Circuit Design of Descriptors in SIFT[J]. 2014, 31(9): 54-57.
李茜, 桑红石, 张静. SIFT描述子高效扫描控制电路结构设计[J]. 微电子学与计算机, 2014, 31(9): 54-57. DOI：

LI Qian, SANG Hong-shi, ZHANG Jing. Efficient Sampling Control Circuit Design of Descriptors in SIFT[J]. 2014, 31(9): 54-57. DOI：

摘要

尺度不变特征变化(SIFT)算法是目前在图像配准领域最为活跃的算法之一

但描述子特征向量描述部分的计算复杂度特别高

现有硬件实现方法的数据吞吐率仅为50%.为了克服该瓶颈

提出了一种新型的描述子特征向量扫描控制机制

占用硬件资源少

显著提高有效像素点的采样率.在硬件耗用仅提高1.16%的情况下

平均吞吐率达到77%

与传统方法相比吞吐率提高了54%.

Abstract

Scale-invariant feature transform (SIFT) algorithm is one of the most dynamic algorithms which applied in image matching field.However

the computation complexity of descriptors is especially high.According to existing design method

the throughput rate of the whole module is only 50%.To conquer this bottleneck

we present a new sample method of descriptors in SIFT.The hardware cost of the structure is both small and worthwhile

since the sampling rate of the effective pixels is increased significantly.With 1.16% extra hardware cost

the average throughput reaches 77%.Compared with traditional method

the throughput improved 54%.

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Related Institution

1 Institute of Microelectronics, Tsinghua University

2 Tsinghua National Laboratory for Information Science and Techology

1 Research Centre for Application of New Communication Technologies, Chongqing University of Posts and Telecommunications

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