The Design and Realization of a Multi-Mode SRAM SEU TEST System

ZHENG Hong-chao; YUE Su-ge; DONG Pan; CHEN Li-ming; CHEN Mao-xin

Chinese

您当前的位置：

首页 >

文章列表页 >

The Design and Realization of a Multi-Mode SRAM SEU TEST System

更新时间：2026-09-04

- The Design and Realization of a Multi-Mode SRAM SEU TEST System
- Vol. 31, Issue 9, Pages: 92-95(2014)
- 作者机构：
  
  北京微电子技术研究所机构,北京,100074
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2014
- 稿件说明：
移动端阅览
郑宏超, 岳素格, 董攀, 陈莉明, 陈茂鑫. 一种多模式SRAM单粒子试验系统的设计与实现[J]. 微电子学与计算机, 2014, 31(9): 92-95.

ZHENG Hong-chao, YUE Su-ge, DONG Pan, et al. The Design and Realization of a Multi-Mode SRAM SEU TEST System[J]. 2014, 31(9): 92-95.
郑宏超, 岳素格, 董攀, 陈莉明, 陈茂鑫. 一种多模式SRAM单粒子试验系统的设计与实现[J]. 微电子学与计算机, 2014, 31(9): 92-95. DOI：

ZHENG Hong-chao, YUE Su-ge, DONG Pan, et al. The Design and Realization of a Multi-Mode SRAM SEU TEST System[J]. 2014, 31(9): 92-95. DOI：

摘要

提出了一种基于NIOS II的异步SRAM单粒子效应检测系统

用于评估抗辐射加固SRAM电路的抗单粒子效应能力.该检测系统可以对异步SRAM进行四种工作模式下的动态和静态检测

利用该检测系统在重离子加速器上对一款异步SRAM进行了单粒子效应试验

获得了5种离子的试验数据

统计分析后得到了器件的单粒子翻转阈值、单粒子翻转饱和截面和单粒子翻转在轨错误率

并与国外同款电路进行了对比

最后依据试验结果给出了评估结论.

Abstract

This paper presents a NIOS II-based Single Event Effects detection system of asynchronous SRAM

which is used to evaluate the single-event-effect capabilities of anti-radiation hardened SRAM circuit.The detection system can be used for dynamic and static testing of asynchronous SRAM in four operating mode.The experimental data of five kindsicons are obtained under the heavy ion accelerator by using the detection system with one kind asynchronous SRAM.Single-event-upset threshold、saturated-cross-section and in-orbit-error-rate are taken by statistical analysis of the results

and the results are compared with the same circuit abroad.Based on these experiment results

the assessment conclusion of the device is given at last.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Implementation and verification of a dual-chain power gating strategy for low power design

Research on the design of blockchain-based AI-generated content traceability framework

A high-efficiency charge pump for ultra-low voltage boost systems

A feature-oriented context understanding and slice analysis network for tuberculosis detection

A review of large model development: technological evolution from BERT to Deepseek

Related Author

No data

Related Institution

No data

AI问答

Postal code：100079
Tel：（010）53879206 Email：tmw@bjxintong.com.cn
Technical support is provided by Beijing Founder electronics co., LTD 京ICP备09082226号-64 京公网安备11010602201714号
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰