SEU Fault Injection System Design of SRAM-Based FPGA

DENG Xian-kun; XIAO Li-yi; LI Jia-qiang

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SEU Fault Injection System Design of SRAM-Based FPGA

更新时间：2026-09-04

- SEU Fault Injection System Design of SRAM-Based FPGA
- Vol. 31, Issue 3, Pages: 134-137(2014)
- 作者机构：
  
  哈尔滨工业大学微电子中心,黑龙江,哈尔滨,150001
- 作者简介：
- 基金信息：
- DOI：
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- Published：2014
- 稿件说明：
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邓先坤, 肖立伊, 李家强. SRAM型FPGA的SEU故障注入系统设计[J]. 微电子学与计算机, 2014, 31(3): 134-137.

DENG Xian-kun, XIAO Li-yi, LI Jia-qiang. SEU Fault Injection System Design of SRAM-Based FPGA[J]. 2014, 31(3): 134-137.
邓先坤, 肖立伊, 李家强. SRAM型FPGA的SEU故障注入系统设计[J]. 微电子学与计算机, 2014, 31(3): 134-137. DOI：

DENG Xian-kun, XIAO Li-yi, LI Jia-qiang. SEU Fault Injection System Design of SRAM-Based FPGA[J]. 2014, 31(3): 134-137. DOI：

摘要

在研究SRAM型FPGA配置存储器物理结构及配置结构的基础上，发现对FPGA配置文件中的帧数据进行0/1翻转可以实现配置存储器的人为翻转，从而来仿真FPGA的SEU效应.基于部分重构技术设计了一种针对SRAM型FPGA的SEU故障注入系统，通过ICAP来实现部分重构，不需要额外的硬件开销.故障注入系统在XUP XC2VP30开发板上实现，通过对三个FPGA典型设计进行SEU敏感性分析，验证了所设计系统的有效性，并验证了三模冗余的加固效果.

Abstract

Based on the research of configuration memory and configuration structure of SRAM-based FPGAs

find that if the frame data in FPGA configuration file is 0/1 inverted

the configuration memory will be artificially flipped correspondingly.So single event upset (SEU) effect of FPGA can be simulated.Based on partial reconfiguration technology

propose a fault injection system to evaluate SEU in SRAM-based FPGA.Partial reconfiguration is realized by ICAP

without additional hardware.The fault injection system is implemented on XUP XC2VP30 board.By the analyze of the sensitivity of SEU of three typical FPGA design

verify the effectiveness of the system and the hardening effect of three modular redundancy.

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