A New Embryonic Digital Circuit Fault Detection Method Based on LUT and Dual Modular Redundancy

WANG Tao; CAI Jin-yan; MENG Ya-feng

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A New Embryonic Digital Circuit Fault Detection Method Based on LUT and Dual Modular Redundancy

更新时间：2026-09-04

- A New Embryonic Digital Circuit Fault Detection Method Based on LUT and Dual Modular Redundancy
- Vol. 33, Issue 7, Pages: 102-105(2016)
- 作者机构：
  
  军械工程学院电子与光学工程系,河北,石家庄,050003
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2016
- 稿件说明：
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王涛, 蔡金燕, 孟亚峰. 一种基于LUT和二模冗余的胚胎数字电路故障检测方法[J]. 微电子学与计算机, 2016, 33(7): 102-105.

WANG Tao, CAI Jin-yan, MENG Ya-feng. A New Embryonic Digital Circuit Fault Detection Method Based on LUT and Dual Modular Redundancy[J]. 2016, 33(7): 102-105.
王涛, 蔡金燕, 孟亚峰. 一种基于LUT和二模冗余的胚胎数字电路故障检测方法[J]. 微电子学与计算机, 2016, 33(7): 102-105. DOI：

WANG Tao, CAI Jin-yan, MENG Ya-feng. A New Embryonic Digital Circuit Fault Detection Method Based on LUT and Dual Modular Redundancy[J]. 2016, 33(7): 102-105. DOI：

摘要

研究了数字电路故障的基本特点

结合电路自修复对故障信息的要求

提出了一种基于LUT和二模冗余的故障检测方法

该方法利用LUT来存储细胞正常工作的状态

利用正常工作状态和实际工作状态的对比

来实现细胞工作状态的实时监测

从而检测细胞是否故障.该方法能够同时对多个细胞进行检测

增加故障覆盖率

减少了设计的复杂程度和硬件资源的消耗

具有很好的工程实用价值.

Abstract

In this paper

the basic characteristics of the digital circuit fault are studied

combining the demands of circuit on the fault detection

a new method based on LUT and dual modular redundancy is proposed.Using the LUT to storage the normal state of working cell

comparing the normal output of working cell and the actual output of working cell

to realize the real-time detection of the working cell

to detect whether the working cell is failure or not.This method can simultaneously test multiple cells

reducing the complexity of the circuit system and the consumption of hardware resources

which has great engineering application value.

关键词

Keywords

references

王南天. 基于原核仿生阵列的自修复技术研究[D]. 长沙: 国防科学技术大学, 2011.

杨仕元. 数字系统的故障诊断与可靠性设计[M]. 北京: 清华大学出版社, 1999.

Mange D, Sanchez E, Staiffer A. Embryonics: a new methodology for designing field-programmable gate arrays with self-repair and self-replicating properties[J]. IEEE Transactions on Very Large Scale Integration(VLSI). 1998, 6(3): 387-399. DOI: 387

R Canham, ATyrrell. An embryonic array with improved efficiency and fault tolerance[C]//Proceedings NAST/DoD Conference on Evolvable Rlardwre. [s. l. ]: IEEE, 2003: 265-272.

Lucian Prodan, Mihai Udrescu, Mircea Vladutiu. Selfrepairing embryonic memory arrays[C]//Proceedings2004NASA/DoD Conference on Evolvable Hardware. [s. l. ]: IEEE, 2004: 130-131.

周贵峰, 钱彦岭, 王南天, 等. 胚胎型仿生硬件结构FIR滤波器设计与仿真[J]. 电子测量与仪器学报, 2010, 24(增刊): 61-65. DOI: 61

王友仁, 崔坚, 游霞, 等. 仿生硬件及其发展[J]. 中国空间科学技术, 2004, 36(1): 32-42. DOI: 32

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