Test Methods for Antifuse-Based FPGAs

MA Jin-long; LU Li-bing

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Test Methods for Antifuse-Based FPGAs

更新时间：2026-09-04

- Test Methods for Antifuse-Based FPGAs
- Vol. 33, Issue 8, Pages: 168-172(2016)
- 作者机构：
  
  中国电子科技集团公司第五十八研究所,江苏,无锡,214035
- 作者简介：
- 基金信息：
- DOI：
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- Published：2016
- 稿件说明：
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马金龙, 卢礼兵. 基于反熔丝的FPGA的测试方法[J]. 微电子学与计算机, 2016, 33(8): 168-172.

MA Jin-long, LU Li-bing. Test Methods for Antifuse-Based FPGAs[J]. 2016, 33(8): 168-172.
马金龙, 卢礼兵. 基于反熔丝的FPGA的测试方法[J]. 微电子学与计算机, 2016, 33(8): 168-172. DOI：

MA Jin-long, LU Li-bing. Test Methods for Antifuse-Based FPGAs[J]. 2016, 33(8): 168-172. DOI：

摘要

首先介绍了基于反熔丝的FPGA的典型结构

接着介绍了基于反熔丝的FPGA的可编程逻辑模块(PLM)、布局布线以及可编程互连资源

然后讨论了基于反熔丝的FPGA的测试模式

最后提出了一种ATE和实装板相结合的测试方法

实验结果表明

该测试方法在芯片未编程状态下

实现了对基于反熔丝的FPGA的测试.

Abstract

The classic architecture of antifuse-based FPGAs was described. Then the details about programmable logic module (PLM)

placement and routing

programmable interconnection of antifuse-based FPGAs was presented. According to the test patterns of antifuse-based FPGA

a method for antifuse-based FPGA test

which combined ATE and mounting plate

was proposed. The results of the test experiments showed that the employed method can achieve successful test and confirmation of unprogrammed device at the factory.

关键词

Keywords

references

Inoue T, Miyazaki S, fujiwara H, et al. Universal fault diagnosis for lookup table FPGA[J]. IEEE Design Test Comput, 1998, 15(1-3): 39-44. DOI: 39

Huang W k, Meyer F J, Chen X-T, et al. Testing configurable LUT - based FPGAs[J]. IEEE Trans VLSI Syst, 1998, 6(7): 276-283. DOI: 276

张旭, 马金龙, 胡凯, 等. 反熔丝型FPGA编程方法的研究[J]. 微电子学, 2011, 41(6): 856-859 DOI: 856

杨海钢, 孙嘉斌, 王慰, 等. FPGA器件设计技术发展综述[J]. 电子与信息学报, 2010, 32(3): 714-727 DOI: 714

钱海涛, 李威, 张大华, 等. 反熔丝FPGA配置算法与软件实现[J]. 微电子学与计算机, 2013, 30(4): 63-66. DOI: 63

张凯虹. 一种FPGA验证与测试方法介绍[J]. 计算机与数字工程, 2010, 38(9): 70-72. DOI: 70

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Related Institution

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