综合使用了三模冗余、EDAC(Error Detection And Correction)电路、CPU流水线重启和Cache强制不命中等容错方法.使用故障注入的方法测试寄存器文件加固后系统的软错误敏感性
对寄存器加固效果进行评估.并在FPGA上进行原型实现
对比加固前后的速度及开销情况.
Abstract
For the high reliability of digital sun sensor in aerospace applications
the SEU-tolerant design for Leon3-based digital sun sensor SoC in RTL level was fulfilled. In considerations of the speed and size of the entire system
we adopt various strengthening methods for different parts of SoC
including triple modular redundancy
EDAC (Error Detection And Correction) circuit
pipeline restart of CPU
forcing cache to miss
etc. in order to evaluate the strengthening effect of registers
we need the soft error sensitivity getting from the fault injection test on the system with register file strengthened. Then
the prototype was implemented in FPGA and compared the speed and overhead with non-strengthened design.
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references
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