To overcome the weakness of algorithm complexity and less robust by traditional binary feature extraction algorithm
this paper presents a novel binary feature extraction method with certain global reference and robustness. Firstly
Harris feature points and Saliency map are obtained from the input matching image. Secondly
the image space is partitioned into grid in order to get the grid center
which is sorted according to the saliency degree of the corresponding grid to generate the global reference vector. Finally
the feature points are compared with the global reference vector to generate the binary feature based on the saliency weighted. Experimental results show that the proposed algorithm can greatly reduce the computational burden
and has a good ability of characterization.
关键词
Keywords
references
Bay H, Tuytelaars T, Van G. SURF: speeded up robust features[C]//Proceedings of the 9th European Conference on Computer Vision Graz. Berlin: Springert, 2006, 3951: 404-417.
Mikolajczyk K, Schmid C. A performance evaluation of local descriptors[J]. IEEE Transaction on Pattern Analysis and Machine Intelligence, 2005(27): 1615-1630. DOI: 1615
Lowe D G. Distinctive image features from scale-invariant key-points[J]. International Journal of Computer Vision, 2004, 60: 91-110. DOI: 91
Chan K W, Chan K L. Optimisation of multi-level block truncation coding[J]. Signal Processing: Image Communication, 2001, 16: 445-459. DOI: 445
Harris C, Stephens M. A combined corner and edge detector[C]//Proceedings of Alvey Vision Conference. Manchester, Britain: BMVA, 1988: 147-151.
Alahi A, Ortiz R, Vandergheynst P. FREAK: fast retina key-point[C]//Proceedings of the 25th IEEE Conference on Computor Vision and Pattern Recognition. Rhode Island, Providence, USA: IEEE, 2012: 16-21.
Calonder M, Lepetit V, Ozuysal M, et al. BRIEF: computing a local binary descriptor very fast[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2012, 34: 1281-1298. DOI: 1281
Itti L, Koch C, Niebur E. A model of saliency-based visual attention for rapid scene analysis[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1998, 20 (11): 1254-1259. DOI: 1254