Test and Debug Technologic Research on Multi-TAPC Chip Based on IEEE 1149.7 Standard

YAN Xue-long; HE Zheng-liang; CHEN Shou-hong

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Test and Debug Technologic Research on Multi-TAPC Chip Based on IEEE 1149.7 Standard

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- Test and Debug Technologic Research on Multi-TAPC Chip Based on IEEE 1149.7 Standard
- Vol. 33, Issue 12, Pages: 71-74(2016)
- 作者机构：
  
  1. 桂林电子科技大学机构电子工程与自动化学院,广西,桂林,541004
  2. 广西自动检测技术与仪器重点实验室,广西,桂林,541004
- 作者简介：
- 基金信息：
- DOI：
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- Published：2016
- 稿件说明：
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颜学龙, 何正亮, 陈寿宏. 基于IEEE 1149.7标准的多TAPC芯片的测试和调试技术研究[J]. 微电子学与计算机, 2016, 33(12): 71-74, 79.

YAN Xue-long, HE Zheng-liang, CHEN Shou-hong. Test and Debug Technologic Research on Multi-TAPC Chip Based on IEEE 1149.7 Standard[J]. 2016, 33(12): 71-74.
颜学龙, 何正亮, 陈寿宏. 基于IEEE 1149.7标准的多TAPC芯片的测试和调试技术研究[J]. 微电子学与计算机, 2016, 33(12): 71-74, 79. DOI：

YAN Xue-long, HE Zheng-liang, CHEN Shou-hong. Test and Debug Technologic Research on Multi-TAPC Chip Based on IEEE 1149.7 Standard[J]. 2016, 33(12): 71-74. DOI：

摘要

以CJTAG标准和JTAG标准为依据

在深入研究这两个标准的基础上

利用Quartus Ⅱ开发平台和Verilog HDL语言设计了多TAPC结构

并用Modelsim进行仿真验证

结果表明多TAPC结构能够有效地对多TAPC芯片进行测试和调试.

Abstract

In this paper

based on the JTAG Standard and CJTAG Standard

in-depth study on the standards

using the Platform of Quartus Ⅱ and Verilog HDL language to design multi-TAPC architecture and simulation by using the Modelsim simulation tool. The results indicate that multi TAPC architecture can be effictively tested and debugged multi TAPC chip.

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references

IEEE. IEEE Std 1149.1-2001 standard test access port and boundary-scan archutecture[S]. New York: IEEE Standard Board, 2001.

IEEE Std 1149.7. IEEE standard for reduced-pin and enhanced-functionality test access and boundary-scan architecture[S]. American: IEEE, 2009.

陈光礻禹, 潘中良. 可测性设计技术[M]. 北京: 电子工业出版社, 1997.

黄文君. 基于IEEE 1149.7边界扫描技术的研究[D]. 桂林: 桂林电子科技大学, 2001.

金辉, 华斯亮, 张铁军, 等. 基于JTAG标准的处理器片上调试的分析和实现[J]. 微电子学与计算机, 2007, 24(6): 116-117. DOI: 116

郑晓光, 白国强. 一种基于JTAG的SOC测试电路设计及实现[J]. 微电子学与计算机, 2009, 26(1): 187-189. DOI: 187

彭立章, 朱敏, 杨春玲. 基于SOPC的边界扫描试控制器开发[J]. 电子测量技术, 2007, 30(12): 141-146. DOI: 141

陈寿宏, 颜学龙, 黄新. 基于IEEE 1149.7标准的CJTAG测试设计方法研究[J]. 测控技术与仪器仪表, 2013, 39(1): 79-82. DOI: 79

徐志磊. 基于IEEE1149.7的新一代测试界接口实现与应用[J]. 信息技术, 2010, 34(8) : 164-166. DOI: 164

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