Aiming at the problem of the existing SoC test methods required long testing time

this paper proposes a multiple IP core concurrent test method based on genetic algorithm. This method is mainly under the condition of the power consumption constraints

through the genetic algorithm as much as possible of the IP core test data compression. In other words

a bus access multiple IP core with the same test data

make each time the number of IP core of concurrent test to achieve the most. This method not only can reduce the size of the test data set

and can reduce the demand for bus bits wide. By using genetic algorithm to calculate the best test scheme of simulation show that the method is feasible

and can greatly shorten the test time.