Study on Self-Masking and Multiple Path Sensitization of Critical Path Tracing Algorithm

HOU Ming-xing; HE Liang; HUANG Bin-ke; ZHANG Xi-jun

Chinese

您当前的位置：

首页 >

文章列表页 >

Study on Self-Masking and Multiple Path Sensitization of Critical Path Tracing Algorithm

更新时间：2026-09-04

- Study on Self-Masking and Multiple Path Sensitization of Critical Path Tracing Algorithm
- Vol. 33, Issue 11, Pages: 99-103(2016)
- 作者机构：
  
  1. 西安交通大学电子与信息工程学院,陕西,西安,710049
  2. 中国电子科技集团公司第四十一研究所,山东,青岛,266555
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2016
- 稿件说明：
移动端阅览
侯明星, 何亮, 黄斌科, 张喜俊. 临界路径跟踪算法中自屏蔽和多路敏化现象的研究[J]. 微电子学与计算机, 2016, 33(11): 99-103.

HOU Ming-xing, HE Liang, HUANG Bin-ke, et al. Study on Self-Masking and Multiple Path Sensitization of Critical Path Tracing Algorithm[J]. 2016, 33(11): 99-103.
侯明星, 何亮, 黄斌科, 张喜俊. 临界路径跟踪算法中自屏蔽和多路敏化现象的研究[J]. 微电子学与计算机, 2016, 33(11): 99-103. DOI：

HOU Ming-xing, HE Liang, HUANG Bin-ke, et al. Study on Self-Masking and Multiple Path Sensitization of Critical Path Tracing Algorithm[J]. 2016, 33(11): 99-103. DOI：

摘要

目前临界路径跟踪算法中确定扇出源临界性时

未同时考虑扇出源的自屏蔽和多路敏化现象

进而导致处理结果出现近似问题

对此研究了自屏蔽和多路敏化现象对扇出源临界性的影响

提高了算法的准确性.通过使用18值符号仿真

可以同时检测固定故障和跳变时延故障

提高了算法的有效性.使用C++编程语言对改进后的临界路径跟踪算法进行实现

并应用于ISCAS’85标准电路进行故障模拟

实验结果证明了该算法的准确性和高效性.

Abstract

Current critical path tracing algorithm will lead approximation of results in fault diagnosis

since self-masking and multiple path sensitization in determining criticality of fan-out stem are not considered. The present paper studies the effects of self-masking and multiple path sensitization on determining criticality of fan-out stem

and the accuracy of the algorithm is improved. Based on an 18-valued algebra in symbolic simulation

stuck-at faults and transition faults can be detected simultaneously

and the efficiency of the algorithm is improved. Critical path tracing algorithm

considering self-masking and multiple path sensitization in determining the criticality of fan-out stem

is implemented with the C++ language. The improved algorithm is applied to ISCAS85 standard circuits for fault diagnosis

and experimental results prove the accuracy and efficiency of the algorithm.

关键词

Keywords

references

Bosio A, Girard P, Pravossoudovich S, et al. SoC symbolic simulation: a case study on delay fault testing[J]. IEEE Workshop on Design Diagnostic of System, 2008, 16(5): 966-975. DOI: 966

Girard P, Landrault C, Pravossoudovitch S. A reconvergent fanout analysis for the CPT algorithm used in delay-fault diagnosis[C]//proceedings of the date European Test Conference. Rotterdam, Netherlonds: IEEE, 1993: 83-88.

Bosio A, Di Natale G. LIFTING: a Flexible Open-so simulator[C]//proceedings of the 20087 17th Asian Test Symposium. Washington, DC, USA: ACM, 2008: 35-40.

Wu L, Walker D M H. A fast algorithm for critical path tracing in VLSI digital circuits[C]//IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. Monterey, CA, USA: IEEE, 2005: 178-186.

杨士元. 数字系统的故障模拟与可靠性设计[M]. 北京: 清华大学出版社, 2000.

Abramovici M, Menon P R, Miller D T. Critical proceedings of the 20th path tracing - An alternative to fault simulation[C]//IEEE Design Automation Conference. Piscataway NJ, USA: ACM, 1983: 214-220.

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Aerial vehicle detection algorithm based on multi-scale fusion and small-object enhancement

Research on the design of blockchain-based AI-generated content traceability framework

Microservices anomaly detection based on the correlation of monitoring metrics

Aerial small object detection algorithm based on improved RT-DETR

A high-efficiency charge pump for ultra-low voltage boost systems

Related Author

No data

Related Institution

No data

AI问答

Postal code：100079
Tel：（010）53879206 Email：tmw@bjxintong.com.cn
Technical support is provided by Beijing Founder electronics co., LTD 京ICP备09082226号-64 京公网安备11010602201714号
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰