Using Spectral Radius with Trace to Achieve Fault Diagnosis and Parametric Identification for Analog Circuits

ZHOU Qi-zhong; XIE Yong-le; XIE Xuan

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Using Spectral Radius with Trace to Achieve Fault Diagnosis and Parametric Identification for Analog Circuits

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- Using Spectral Radius with Trace to Achieve Fault Diagnosis and Parametric Identification for Analog Circuits
- Vol. 33, Issue 11, Pages: 109-113(2016)
- 作者机构：
  
  1. 电子科技大学自动化工程学院,四川,成都,611731
  2. 宜宾学院机构物理与电子工程学院,四川,宜宾,644007
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2016
- 稿件说明：
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周启忠, 谢永乐, 谢暄. 用谱半径和迹实现模拟电路故障诊断与参数辨识[J]. 微电子学与计算机, 2016, 33(11): 109-113, 118.

ZHOU Qi-zhong, XIE Yong-le, XIE Xuan. Using Spectral Radius with Trace to Achieve Fault Diagnosis and Parametric Identification for Analog Circuits[J]. 2016, 33(11): 109-113.
周启忠, 谢永乐, 谢暄. 用谱半径和迹实现模拟电路故障诊断与参数辨识[J]. 微电子学与计算机, 2016, 33(11): 109-113, 118. DOI：

ZHOU Qi-zhong, XIE Yong-le, XIE Xuan. Using Spectral Radius with Trace to Achieve Fault Diagnosis and Parametric Identification for Analog Circuits[J]. 2016, 33(11): 109-113. DOI：

摘要

为解决模拟电路参数辨识困难和故障诊断成本高的问题

提出一种基于矩阵的迹和谱半径的模拟电路故障诊断和参数辨识方法.该方法以矩阵理论为支撑

把被测电路输出电压的时间序列组成响应矩阵

以响应矩阵的谱半径和迹随被诊断器件参数的变化而变化的对应关系为基础

建立了故障模型.该模型将故障检测、故障定位和参数辨识一体化处理

具有易于工程实施的优点

解决了基于数字信号处理与人工智能的方法难以实现模拟电路故障参数辨识的不足.实验结果表明该方法的故障定位和故障参数辨识精度高

计算时间开销小

测试成本低.

Abstract

To realize the parameter identification and reduce the fault diagnosis cost of analog circuits

a methodology on fault location and parameter identification method for analog circuits based on the spectral radius and trace is proposed. Applying of matrix theory

the fault diagnosis model is established according to the correspondence between the fault device parameter variations and the change of the spectral radius and trace of response matrix of circuit under test (CUT). The fault detection

fault localization and parameter identification are integrated into one framework

the proposed method has the characters of low test cost and easy implementatiom. Experimental results show that this method is effective and the fault diagnosis accuracy and computational time overhead are satisfactory.

关键词

Keywords

references

Oxford Wilkinson J H. The algebraic eigenvalue problem[M]. Oxford: Clarendon, 1988: 62-64. DOI: 62

Farzan Aminian, Mehran Aminian, Collins H W. Analog fault diagnosis of actual circuits using neural networks[J]. IEEE Transactions on Instrumentation and Measurement, 2002, 51(3): 544-550. DOI: 544

Yang C, Tian S, Liu Z, et al. Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits[J]. Instrumentation and Measurement, IEEE Transactions on, 2013, 62(11): 2730-2738. DOI: 2730

Kaminska B, Arabi K, Bell I. Analog and mixed-signal benchmark circuits—First release[C]//Proc ITC. Washington, DC: IEEE, 1997: 183-190.

Z Li. A Novel Fault Diagnostic Method Based on Node-Voltage Vector Ambiguity Sets[J]. Instrumentation and Measurement, IEEE Transactions on, 2014, 63(8): 1957-1965. DOI: 1957

Roh J, Abraham J A. Subband filtering for time and frequency analysis of mixed-signal circuit testing[J]. IEEE Trans Instrum Meas, 2004, 53(2): 602-611. DOI: 602

刘美容, 张立玮. 基于小波分解和模糊聚类的模拟电路软故障诊断[J]. 微电子学与计算机, 2014, 31(12): 140-143. DOI: 140

张朝龙, 何怡刚, 袁莉芬, 等. 基于核熵成分分析的模拟电路早期故障诊断方法[J]. 仪器仪表学报, 2015, 36(3): 675-683. DOI: 675

许军, 张耀辉, 陈圣俭. 基于结点电压增量的模拟电路多故障诊断方法研究[J]. 微电子学与计算机, 2015, 32(2): 138-141. DOI: 138

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