A solution of cache error detection and correction based on LEON2 processor was brought forward in this paper
to meet the fault tolerance requirements of radiation hardened microprocessor
especially for Multi-Bit Upset caused by single event effect in cache. Rather
parallel BCH (Bose-Chaudhuri-Hocquenghem) encoder and decoder were designed for tag memory and data memory of instruction cache and data cache
which could achieve error detection up to four bits. Also it could handle the faults effectively after checking out them. Experimental results based on LEON2 showed that this design could efficiently handle multi-bit error due to single event effect in cache
and its resource and performance overhead was acceptable
thus it would support for fault tolerance design of the future nanoscale microprocessor.
Radaelli D, Puchner H, Skip Wong, et al. Investigation of multi-bit upsets in a 150 nm technology SRAM device[J]. IEEE Transactions on Nuclear Science, 2005, 52(6): 2433-2437. DOI: 2433
Baumann R C. Soft Errors in advanced semiconductor devices- Part 1: The three radiation source[J]. IEEE Transactions on Device and Materials Reliability, 2001, 1(1): 17-22. DOI: 17
Alaa R Alameldeen, Ilya Wagner, Zeshan Chishti, et al. Energy-Efficient Cache Design Using Variable-Strength Error-Correcting Codes[C]//proceedings of the 38th annual international symposium on Computor architecture. New York, NY, USA: 2011: 461-472.