Considering that the large thermal effect produced by chips in the process of testing will damage the reliability of the chips

in this paper

a new method using improved quantum-inspired evolutionary algorithm of multi populations is proposed to optimize the test power consumption. The proposed method is meant to reduce the test cost and prevent the chip from being damaged due to excessive power consumption. In order to avoid the single population cant guarantee the diversity of populations

this paper combines multiple populations operation with algorithm and adopts the strategy of crossover in excellent individuals to improve the ability of global optimization. Taking ITC02 standard circuit as the test object

the experiment results demonstrate that the proposed method can converge to the optimal solution quickly

which can reduce the total test time and improve the test efficiency

in addition

the test power consumption is optimized under the constraint of the test time.