An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP

WANG Yue-ling; XUE Hai-wei; GUO gang; LEI Zhi-jun; SHI Shu-ting; LIU Jian-cheng

Chinese

您当前的位置：

首页 >

文章列表页 >

An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP

更新时间：2026-09-04

- An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP
- Vol. 35, Issue 10, Pages: 53-57(2018)
- 作者机构：
  
  1. 中国电子科技集团公司第五十八研究所,江苏,无锡,214035
  2. 中国原子能科学研究院机构,北京,102413
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2018
- 稿件说明：
移动端阅览
王月玲, 薛海卫, 郭刚, 雷志军, 史淑廷, 刘建成. 一种用于评估抗辐射DSP单粒子翻转的试验方法[J]. 微电子学与计算机, 2018, 35(10): 53-57.

WANG Yue-ling, XUE Hai-wei, GUO gang, et al. An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP[J]. 2018, 35(10): 53-57.
王月玲, 薛海卫, 郭刚, 雷志军, 史淑廷, 刘建成. 一种用于评估抗辐射DSP单粒子翻转的试验方法[J]. 微电子学与计算机, 2018, 35(10): 53-57. DOI：

WANG Yue-ling, XUE Hai-wei, GUO gang, et al. An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP[J]. 2018, 35(10): 53-57. DOI：

摘要

本文提出了评估DSP电路单粒子翻转效应的试验方法

该方法包含单独静态检测SRAM、通过CPU读取内部寄存器和功能检测等三种方式.根据该方法

设计了DSP电路的单粒子翻转检测软件系统和硬件检测系统

并在HI-13串列重离子加速器上进行了单粒子翻转验证试验

获得了待测DSP器件的地面模拟翻转率数据.利用在轨错误率计算软件

计算出在标准辐照注量(1.0E+7 icons/cm)下电路的SEU在轨软错误率约为1.8E-12错误/位天(GEO

等效3 mm Al屏蔽)

运用该方法可以较好的评估DSP电路的单粒子翻转性能.

Abstract

This paper presents a new experimental method to evaluate the SEU performance of radiation-hardened DSP. The method includes three ways of solely detecting SRAM

detecting regs by CPU and function-detecting. Software and hardware detection systems are designed by the method

and SEU experimental test was done on HI-13 heavy-ion accelerator. The results show that the error rate of DSP is about 1.8E-12 error/bit·day(GEO) under irradiation dose of 1.0E+7 icons/cm

which means the experimental method can be used for well evaluating the SEU performance of DSP.

关键词

Keywords

references

Joshi R, Daniels R. Radiation hardness evaluation of a class v 32 bit floating-point digital signal processor[J]. IEEE NSREC, Seattle, WA, USA, 2005: 70-78 DOI: 10.1109/REDW.2005.1532669.

江桂芳, 张大宇.一种DSP器件单粒子翻转效应检测方法[P].西安空间无线电技术研究所, CN103440185A, 2013.

王良江, 韩留军. 1553B总线器件单粒子效应实验系统设计[J].计算机测量与控制.2013, 21(3):753-755. DOI: 753

郑宏超, 岳素格.一种用于ASIC内部存储器单粒子翻转效应评估的方法[J].微电子学与计算机, 2017, 34(10):22-25. DOI: 22

David M Hiemstra, Bojan Miladinovic. Single event upset characterization of the SMJ320C6701 digital signal processor using proton irradition[J]. Radiation Effects Data Workshop, 2009(113) :133-135. DOI: 133

王浩. DSP辐射效应分析及测试方法研究[D].西安: 西安电子科技大学, 2013.

何益百.辐射效应地面试验技术研究[D].长沙: 国防科技大学, 2010.

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

The application of TMR on the high performance and anti radiation DSP

DSP Implementation of Binary BCH Encoding and Decoding

Design of Anti-SEE HD Image Acquisition System Based on FPGA and DSP

The Single Event Function Error Analysis of CPU in High/Low Speed Modes

Design of a UART-based DSP Debugging Platform

Related Author

LIU Xiao-ming

HU Hai-sheng

HU Kong-yang

HU Ze-min

KANG Kai

SHI Hong-sheng

YAN Yuan-hai

FU Fang-fa

Related Institution

No. 38 Research Institute, China Electronics Technology Group Corporation

School of Electrical Engineering, Beijing Jiaotong University

Microelectronics Center, Harbin Institute of Technology

R & D Center, Shanghai Institute of Spaceflight Control Technology

Beijing Microelectronics Technology Institute

AI问答

Postal code：100079
Tel：（010）53879206 Email：tmw@bjxintong.com.cn
Technical support is provided by Beijing Founder electronics co., LTD 京ICP备09082226号-64 京公网安备11010602201714号
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰