High reliability data processing system of satellite based on Godson

SHI Longlong; LIN Baojun; WANG Zhengkai; QI Jianzhong; TU Zhenzhen

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High reliability data processing system of satellite based on Godson

更新时间：2026-09-04

- High reliability data processing system of satellite based on Godson
- Vol. 38, Issue 7, Pages: 25-29(2021)
- 作者机构：
  
  1. 中国科学院机构微小卫星创新研究院,上海,201203
  2. 上海微小卫星工程中心机构,上海,201203
- 作者简介：
- 基金信息：
- DOI：
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- Published：2021
- 稿件说明：
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石龙龙, 林宝军, 王正凯, 祁见忠, 涂珍贞. 基于龙芯的高可靠性卫星数据处理系统[J]. 微电子学与计算机, 2021, 38(7): 25-29.

SHI Longlong, LIN Baojun, WANG Zhengkai, et al. High reliability data processing system of satellite based on Godson[J]. 2021, 38(7): 25-29.
石龙龙, 林宝军, 王正凯, 祁见忠, 涂珍贞. 基于龙芯的高可靠性卫星数据处理系统[J]. 微电子学与计算机, 2021, 38(7): 25-29. DOI：

SHI Longlong, LIN Baojun, WANG Zhengkai, et al. High reliability data processing system of satellite based on Godson[J]. 2021, 38(7): 25-29. DOI：

摘要

为满足长寿命中高轨卫星对数据处理系统的可靠性和系统更新能力的高要求，提出了基于龙芯的高可靠性数据处理系统设计方案.系统以"龙芯+双NorFlash"为硬件架构，设计软件在轨重构方案，采用双冗余总线子板交叉备份设计.实现了系统软件可在轨重构升级，并且显著提高系统可靠性.该系统在MEO卫星上进行了在轨验证.通过在轨运行数据分析，验证了设计的有效性和高可靠性.

Abstract

High reliability and system updating ability of data processing system are required for long-life medium high orbit satellite. a high reliability data processing system based on Godson is proposed. The system takes "Godson + double NorFlash" as the hardware architecture

designs the software reconstruction scheme on orbit

and adopts the cross backup design of sub boards based on dual redundant bus. The system software can be reconstructed and upgraded on orbit

and the system reliability is significantly improved. The system has been verified in orbit on some MEO satellites. The effectiveness and high reliability of the design are verified through the analysis of the on orbit operation data.

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references

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黄超, 陈勇, 林宝军. 基于抗辐照龙芯的星载计算机容错启动研究[J]. 计算机科学, 2016, 43(11A): 532-535. DOI: 532 HUANG C, CHEN Y, LIN B J. Research of fault-tolerant booting for on-board computer based on anti-radiation Loongson[J]. Computer Science, 2016, 43(11A): 532-535. DOI: 532

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