A Screening method for single particle fault injection experimental set for SRAM-FPGA

WANG Meng-ru; ZHOU Shan; ZHANG Chi; WANG Jin-bo

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A Screening method for single particle fault injection experimental set for SRAM-FPGA

更新时间：2026-09-04

- A Screening method for single particle fault injection experimental set for SRAM-FPGA
- Vol. 38, Issue 1, Pages: 38-44(2021)
- 作者机构：
  
  1. 中国科学院大学机构,北京,101408
  2. 中科院空间应用工程与技术中心,北京,100094
- 作者简介：
- 基金信息：
- DOI：
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- Published：2021
- 稿件说明：
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王梦茹, 周珊, 张弛, 王金波. 一种SRAM型FPGA单粒子故障注入实验集的筛选方法[J]. 微电子学与计算机, 2021, 38(1): 38-44.

WANG Meng-ru, ZHOU Shan, ZHANG Chi, et al. A Screening method for single particle fault injection experimental set for SRAM-FPGA[J]. 2021, 38(1): 38-44.
王梦茹, 周珊, 张弛, 王金波. 一种SRAM型FPGA单粒子故障注入实验集的筛选方法[J]. 微电子学与计算机, 2021, 38(1): 38-44. DOI：

WANG Meng-ru, ZHOU Shan, ZHANG Chi, et al. A Screening method for single particle fault injection experimental set for SRAM-FPGA[J]. 2021, 38(1): 38-44. DOI：

摘要

针对目前单粒子故障注入实验中存在的故障注入位置盲目导致的效率低下、耗费大量的时间人力成本从而难以在工程项目中推广的问题

提出一种SRAM型FPGA故障注入实验集的筛选方法用来指导单粒子故障注入.该方法剖析SRAM型FPGA芯片结构

归纳单粒子故障的时间特性

确定单粒子故障模式; 并结合具体FPGA设计的资源占用情况、资源特性、资源连接关系等给出故障注入实验集的筛选和优先级排序方法; 搭建单粒子故障注入原型系统对所提方法进行了工程验证.结果表明提出的单粒子故障注入实验集的筛选和优先级排序方法正确、有效

能快速定位出设计中与功能密切相关的配置位

缩短故障注入的时间成本

使得故障注入方法广泛应用于实际工程成为可能.

Abstract

In view of the inefficiency caused by the blind fault injection in the traditional single-particle fault injection experiment

which consumes a lot of time and manpower and is difficult to apply in practical engineering projects. This paper proposes a screening methodology for SRAM-based FPGA fault injection experiment set to guide single-particle fault injection. This methodology analyzes the SRAM FPGA chip structure

summarizes the time characteristics of single-particle faults

and determines single particle failure mode. The method of screening and prioritizing the fault injection experiment set is given in combination with the resource occupation

resource characteristics

and resource connection relationship of the specific FPGA design. A single-particle fault injection prototype system is constructed to verify the proposed method. The results show that the proposed method is correct and effective

which can quickly locate the function-related configuration bits in the design

shorten the time cost of fault injection

and make the fault injection method widely applicable to practical engineering.

关键词

Keywords

references

李鹏.纳米级SRAM单粒子翻转效应及其诱导的软错误研究[D].长沙: 国防科学技术大学, 2016. LI P. Research on single event upset and its induced soft error of Nano SRAMs[D]. Changsha: National University of Defense Technology, 2016.

ZHANG R S, XIAO L Y, LI J, et al. A fast fault injection platform of multiple SEUs for SRAM-based FPGAs[J]. Microelectronics Reliability, 2018, 82: 147-152. DOI: 10.1016/j.microrel.2018.01.014.

QUINN H, WIRTHLIN M. Validation techniques for fault emulation of SRAM-based FPGAs[J]. IEEE Transactions on Nuclear Science, 2015, 62(4): 1487-1500. DOI: 10.1109/TNS.2015.2456101.

KRETZSCHMA U, ASTARLOA A, JIMéNEZ J, et al. Compact and fast fault injection system for robustness measurements on SRAM-Based FPGAs[J]. IEEE Transactions on Industrial Electronics, 2014, 61(5): 2493-2503. DOI: 10.1109/TIE.2013.2273476.

张森, 石军, 王九龙.卫星在轨失效统计分析[J].航天器工程, 2010, 19(4): 41-46. DOI: 10.3969/j.issn.1673-8748.2010.04.007. ZHANG S, SHI J, WANG J L. Satellite on-board failure statistics and analysis[J]. Spacecraft Engineering, 2010, 19(4): 41-46. DOI: 10.3969/j.issn.1673-8748.2010.04.007.

ZUZARTE M. A tool for run time soft error fault injection into FPGA circuits[D]. Hamilton: McMaster University, 2014.

余永涛.脉冲激光模拟SRAM单粒子效应的试验研究[D].北京: 中国科学院研究生院, 空间科学与应用研究中心, 2015. YU Y T. Research of SRAM single event effects based on pulsed laser testing[D]. Beijing: Graduate School of Chinese Academy of Sciences, Center for Space Science and Application Research, 2015.

何益百.辐射效应地面试验技术研究[D].长沙: 国防科学技术大学, 2010. HE Y B. Research on radiation effects ground-based testing technology[D]. Changsha: National University of Defense Technology, 2010.

HARBOE S R. 40 years of radiation single event effects at the European space agency, ESTEC[J]. IEEE Transactions on Nuclear Science, 2013, 60(3): 1816-1823. DOI: 10.1109/TNS.2013.2247630.

马英起, 封国强, 上官士鹏, 等.脉冲激光试验评估模拟电路单粒子效应[J].信息与电子工程, 2012, 10(5): 633-638. DOI: 633 MA Y Q, FENG G Q, SHANGGUAN S P, et al. Pulsed laser test of single event effects in analog circuits[J]. Information and Electronic Engineering, 2012, 10(5): 633-638. DOI: 633

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