A fast method of MCU trimming and testing

ZHONG Weikun; LI Jinghu; FU Fangfa

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A fast method of MCU trimming and testing

更新时间：2026-09-04

- A fast method of MCU trimming and testing
- Vol. 38, Issue 7, Pages: 60-66(2021)
- 作者机构：
  
  1. 福建农林大学机构,福建,福州,360000
  2. 哈尔滨工业大学,黑龙江,哈尔滨,163712
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：2021
- 稿件说明：
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钟纬坤, 李景虎, 付方发. 一种快速MCU修调测试方法[J]. 微电子学与计算机, 2021, 38(7): 67-72.

ZHONG Weikun, LI Jinghu, FU Fangfa. A fast method of MCU trimming and testing[J]. 2021, 38(7): 60-66.
钟纬坤, 李景虎, 付方发. 一种快速MCU修调测试方法[J]. 微电子学与计算机, 2021, 38(7): 67-72. DOI：

ZHONG Weikun, LI Jinghu, FU Fangfa. A fast method of MCU trimming and testing[J]. 2021, 38(7): 60-66. DOI：

摘要

为降低具有高精度要求和功能丰富的MCU的修调测试成本，提出一种快速高效的MCU修调测试方法.此方法是将MCU芯片成品通过Flash自动修调补偿来控制电路的输出基准和频率，或者是调整电流，从而实现自动化修调MCU芯片的效果，同时控制MCU模拟从不同pin脚上输出到测试仪器，然后再由软件自动记录测试结果.修调测试使用的是一款工业级8051芯片.测试结果表明: 经过这种修调测试方法可以使MCU满足输出精度要求且能快速得到MCU模拟信号输出，并有效地降低MCU的修调测试成本.

Abstract

In order to reduce the cost of MCU trim test with high precision requirements and rich functions

a fast and efficient MCU trim test method is proposed. This method controls the output reference and frequency of the circuit through Flash automatic adjustment and compensation of the produced MCU chip

or adjusts the current to realize the effect of automatic adjustment of the MCU chip

and controls the MCU analog output to be output from different pins to the test. Furthermore

the instrument automatically records the test results by the software. The trim test uses an industrial grade 8051 chip. The test results show that through this trimming test method

the MCU can not only meet the output accuracy requirements but also quickly obtain the MCU analog signal output

which effectively reduces the MCU trim test cost.

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references

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