Bayesian sequential test method for probability of success of binomial distribution based on posterior probability
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Bayesian sequential test method for probability of success of binomial distribution based on posterior probability
Vol. 28, Issue 2, (2013)
作者机构:
西北核技术研究所 第五研究室,西安,710024
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Published:2013
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HAN Feng, LU Xi-cheng, LIU Yu, et al. Bayesian sequential test method for probability of success of binomial distribution based on posterior probability[J]. 2013, 28(2).
DOI:
HAN Feng, LU Xi-cheng, LIU Yu, et al. Bayesian sequential test method for probability of success of binomial distribution based on posterior probability[J]. 2013, 28(2).DOI:
Bayesian sequential test method for probability of success of binomial distribution based on posterior probability
A sequential test method based on Bayesian posterior probability was proposed to perform tests of hypotheses about probability of success of binomial distribution in complicated hypothesis conditions. The decision rules were constructed and the method for calculating the criterion value was given. For a given maximal sample size
the truncated method of the judge criteria was discussed for hypothesis test. At last
an example illustrated the proposed method and the result was compared with classical methods. The result shows that the sample number determined by the proposed method can be much smaller than that determined by classical methods on the condition of given prior probability.