According to the problem of the significant increasing testing cost of VLSI caused by the low test quality

this paper proposes a novel approach to improve the test sequence quality for scan circuits.Combination test set is transferred into the test sequence and the result sequence can detect more faults under same time cycle.The quality of test is researched at the same time

and a new approach is proposed to improve the test sequence quality by modify the scan select sub-sequence.Experiment result of benchm...