A Test Data Compression Scheme Based on Mixed Compatible Data Blocks

SHANG Jin; ZHANG Li-yong

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A Test Data Compression Scheme Based on Mixed Compatible Data Blocks

更新时间：2026-07-10

- A Test Data Compression Scheme Based on Mixed Compatible Data Blocks
- Vol. 16, Issue 6, Pages: 93-96(2011)
- 作者机构：
  
  1. 哈尔滨理工大学测控技术与通信工程学院
  2. 黑龙江工程学院电子工程系
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN407
- Published：2011
- 稿件说明：
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SHANG Jin, ZHANG Li-yong. A Test Data Compression Scheme Based on Mixed Compatible Data Blocks[J]. 2011, 16(6): 93-96.
DOI：

SHANG Jin, ZHANG Li-yong. A Test Data Compression Scheme Based on Mixed Compatible Data Blocks[J]. 2011, 16(6): 93-96. DOI：

摘要

针对SOC芯片测试数据快速增长的特点

提出了一种有效的测试数据压缩方案.该方案根据测试数据中存在大量无关位

测试数据存在相容性的特点

采用二进制代码来表示具有相容性的测试数据

对符合条件的测试数据采用一位压缩

提高了编码压缩效率.同时提出了一种基于有限状态机和循环移位寄存器的解压缩算法的实现方案

对ISCAS 89部分标准电路实验结果表明

该方案跟同类方案相比

最高平均差值压缩率为13.32%

具有高压缩率、硬件实现简单等特点.

Abstract

According to the characteristics of test data of the SOC rapid increasing

a test data compression scheme based on mixed compatible date blocks is presented.In the scheme

binary code is used to express the test data which are compatible with reference data

and eligible test data are compressed with one-bite compression

which are improved compression radio.The circuit structure of decoder with a finite state machine(FSM) and a cyclical scan register(CSR) was proposed.Experimental results show that...

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Related Author

SHANG Jin

ZHANG Li-yong

Related Institution

哈尔滨理工大学测控技术与通信工程学院

黑龙江工程学院电子工程系

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