The Application of Boundary Scan Test Technology in Radar BIT Circuit

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- The Application of Boundary Scan Test Technology in Radar BIT Circuit
- Modern Radar Issue 1, Pages: 50-53(2000)
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- Revised：1999-01-17，
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察豪, 杨智, 冷东方. 边界扫描测试技术在雷达BIT电路中的应用[J]. 现代雷达, 2000, (1): 50-53.

Cha Hao, Yang Zhi, Leng Dongfang. The Application of Boundary Scan Test Technology in Radar BIT Circuit[J]. Modern Radar, 2000, (1): 50-53.
察豪, 杨智, 冷东方. 边界扫描测试技术在雷达BIT电路中的应用[J]. 现代雷达, 2000, (1): 50-53. DOI：

Cha Hao, Yang Zhi, Leng Dongfang. The Application of Boundary Scan Test Technology in Radar BIT Circuit[J]. Modern Radar, 2000, (1): 50-53. DOI：

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