Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology

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- Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology
- Modern Radar Issue 6, Pages: 1-4(2003)
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- Revised：2002-11-13，
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李桂祥, 杨江平, 王隆刚. 基于边界扫描技术的板级BIT设计及测试策略[J]. 现代雷达, 2003, (6): 1-4.

LI Gui-xiang, YANG Jiang-ping, WANG Long-gang. Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology[J]. Modern Radar, 2003, (6): 1-4.
李桂祥, 杨江平, 王隆刚. 基于边界扫描技术的板级BIT设计及测试策略[J]. 现代雷达, 2003, (6): 1-4. DOI：

LI Gui-xiang, YANG Jiang-ping, WANG Long-gang. Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology[J]. Modern Radar, 2003, (6): 1-4. DOI：

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