雷沃妮. 板载FPGA芯片的边界扫描测试设计[J]. 现代雷达, 2006, (1): 76-78.

LEI Wo-ni. Boundary-scan Test Design for FPGA Chip on Board[J]. Modern Radar, 2006, (1): 76-78.

雷沃妮. 板载FPGA芯片的边界扫描测试设计[J]. 现代雷达, 2006, (1): 76-78. DOI：

LEI Wo-ni. Boundary-scan Test Design for FPGA Chip on Board[J]. Modern Radar, 2006, (1): 76-78. DOI：