High Resolution Test Technique for Electrical Thickness of Transparent Structure

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更新时间：2026-07-27

- High Resolution Test Technique for Electrical Thickness of Transparent Structure
- Modern Radar Vol. 40, Issue 5, Pages: 54-57(2018)
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王克先, 房新蕊. 透波结构的电厚度高分辨率测试技术[J]. 现代雷达, 2018, 40(5): 54-57.

WANG Kexian, FANG Xinrui. High Resolution Test Technique for Electrical Thickness of Transparent Structure[J]. Modern Radar, 2018, 40(5): 54-57.
王克先, 房新蕊. 透波结构的电厚度高分辨率测试技术[J]. 现代雷达, 2018, 40(5): 54-57. DOI：

WANG Kexian, FANG Xinrui. High Resolution Test Technique for Electrical Thickness of Transparent Structure[J]. Modern Radar, 2018, 40(5): 54-57. DOI：

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