Thomas E. Gage, Prabesh Dulal, Peter A. Solheid, et al. Si-integrated ultrathin films of phase-pure Y3Fe5O12 (YIG) via novel two-step rapid thermal anneal[J]. Materials Research Letters, 2017, 5(6): 379-385.
DOI:
Thomas E. Gage, Prabesh Dulal, Peter A. Solheid, et al. Si-integrated ultrathin films of phase-pure Y3Fe5O12 (YIG) via novel two-step rapid thermal anneal[J]. Materials Research Letters, 2017, 5(6): 379-385.DOI: 10.1080/21663831.2017.1295285.
Si-integrated ultrathin films of phase-pure Y3Fe5O12 (YIG) via novel two-step rapid thermal anneal
BSTRACTTraditional one-step annealing of ultrathin amorphous Y–Fe–O films on Si has been reported to yield ‘incomplete crystallization’. Here
it is shown that films produced by standard anneals (e.g.: 800°C
3 min) actually contain yttrium iron garnet (YIG) crystallites in a nanocrystalline non-garnet matrix. During
in situ
TEM laser annealing
a low-temperature pre-anneal enabled subsequent YIG crystallization at velocities of 280 nm/s that prevented the formation of the nanocrystalline matrix. From these results
a two-step rapid thermal anneal was identified (400°C
3 min; 800°C
3 min) that successfully produces phase-pure garnet films on SiO
Atomistic mechanism of nucleation and growth of a face-centered orthogonal phase in small-sized single-crystalline Mo
Synthesis of thin films with highly tailored microstructures
Mechanically controlling the reversible phase transformation from zinc blende to wurtzite in AlN
Cavity Evolution at Grain Boundaries as a Function of Radiation Damage and Thermal Conditions in Nanocrystalline Nickel
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