New Solving Method for Voltage Endurance Coefficient N of Transformer Turn-to-turn Insulation under Step-voltage

KE Chun-jun; LIN Chun-yao; OU Xiao-bo; WEI Xin-lao; NIE Hong-yan; CHI Ming-he; LIN Lin

doi:10.15938/j/jhust.2016.05.013

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New Solving Method for Voltage Endurance Coefficient N of Transformer Turn-to-turn Insulation under Step-voltage

更新时间：2026-08-31

- New Solving Method for Voltage Endurance Coefficient N of Transformer Turn-to-turn Insulation under Step-voltage
- Vol. 21, Issue 5, Pages: 66-72(2016)
- 作者机构：
  
  1. [1]广东电网有限责任公司,广东,广州,510600
  2. [2]哈尔滨理工大学科技发展总公司,黑龙江,哈尔滨,150040
- 作者简介：
- 基金信息：
- DOI：10.15938/j/jhust.2016.05.013
  CLC： TM85
- Published：2016
- 稿件说明：
移动端阅览
KE Chun-jun, LIN Chun-yao, OU Xiao-bo, et al. New Solving Method for Voltage Endurance Coefficient N of Transformer Turn-to-turn Insulation under Step-voltage[J]. 2016, 21(5): 66-72.
DOI：

KE Chun-jun, LIN Chun-yao, OU Xiao-bo, et al. New Solving Method for Voltage Endurance Coefficient N of Transformer Turn-to-turn Insulation under Step-voltage[J]. 2016, 21(5): 66-72. DOI： 10.15938/j/jhust.2016.05.013.

摘要

针对在进行步进电压下的变压器匝间绝缘加速电老化试验时

采用传统方法求解反幂模型的电压寿命指数N比较繁琐的问题

提出了一种新的求解方法 .进行了步进电压下500 k V电力变压器的匝间绝缘模型线圈的加速电老化试验

利用所提的方法算出了模型线圈的反幂模型寿命公式

并通过恒定电压试验验证了该模型的正确性.结果表明

本文所提出的新算法

可以用于步进电压下变压器匝间绝缘反幂模型中电压寿命指数N的求解

该方法较传统方法简单.

Abstract

For the accelerated electrical ageing test of transformer turn-to-turn insulation under the step-stress voltage

it is a complicated problem when the traditional method was taken to calculate the voltage endurance coeffi- cient N of inverse power model. A new solving method was proposed. The accelerated electrical ageing test of trans- former turn-to-turn insulation under the step-stress voltage of 500 kV was carried on. The power model formula of inverse power model was calculated using the proposed method

and the correctness was verified by constant voltage test. The result shows that the new method can be used to calculate the voltage endurance coefficient N of trans- former turn-to-turn insulation under the step-stress voltage

and the new method is simpler than the traditional method.

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