A novel scan chain partition approach considering test power is presented.The peak test power and average test power of scan-based design circuits is modeled firstly
then the conclusion of test power are produced by the switching activity is obtained
considering the situation of multi-chain
to search the compatible cell from the input test set and make use of the compatibility of the scan cells
considering the layout information
distribute the scan cells to different scan chains
the multi-chain partition approach is based on Graph theory.The experiments on ISCAS89 benchmark show our approachs efficiency.The average test power and peak test power are reduced dramatically.