WEI Hai-long, LIU You-bao, LIU Zhi, et al. A Kind of Low-Voltage High-efficient On-chip Current Testing Technology for Monolithic DC/DC[J]. 2012, 29(10): 55-59.
WEI Hai-long, LIU You-bao, LIU Zhi, et al. A Kind of Low-Voltage High-efficient On-chip Current Testing Technology for Monolithic DC/DC[J]. 2012, 29(10): 55-59.DOI:
比常规采用功率管镜像电流检测技术的静态电流峰值低1.5个量级左右.转换器基于0.5μm 2P3M Mixed Signal CMOS工艺设计制作.测试结果表明
电流检测电路的最大检测电流1.1A
转换器的输入最低电压2.3V
重负载转换效率高于93%.
Abstract
In this paper
A kind of low-voltage high-efficient on-chip current sensing circuit for monolithic current- mode switch DC/DC converter is proposed. The circuit makes use of power transistor equivalent resistor current sensing technique and source-input differential voltage amplification technique. As a result
the power supply range can be as low as 2. 3V
-- 3dB bandwidth is up to 12 MHz and the quiescent current peak is only 19~A under maximum load current
which is about I. 5 orders lower than the quiescent current peak using traditional power transistor mirror-current sensing. The converter is designed and fabricated in 0.5~tm 2P3M Mixed Signal CMOS process. The test results show that the maximum sensing current of 1.1A
minimum power supply voltage of the converter is 2.3V
the conversion efficiency is higher than 93% under heavy load.