This paper focuses on researching the SEU fault tolerance of nano-scale Cross Couple Domino dynamic gate which builds essential parts of high performance micro-processor.A novel single event upset immune XC Domino dynamic gate based on stable structure is proposed.Through circuit simulation by Spectre

the novel method can fulfill the SEU fault tolerance over glitches of double Vdd magnitude.Compared with conventional fault tolerant XC Domino dynamic gate

the SEU immune XC Domino dynamic gate obtained apparent advantages consisted of 13.64% reduction in gate delay

47.37% reduction in silicon area and 75.54% reduction in circuit power.