This paper analysis TSV arrays positive effect on circuits reliability and negative effect on timing and wire length by complete the 3D circuit (HEVC motion estimation circuit) back-end design with it. Results of the research indicated that one TSV array could have one redundant TSV in a 3*3 TSV array
and the reliability improved 11.98%
power consumption and wire length increased 19.6% and 19.2%.
关键词
Keywords
references
Yao W, Shi F, He L, et al. Power-bandwidth trade-off on TSV array in 3D IC and TSV-RDL junction design challenges[C]// Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on. Tempe, AZ: IEEE, 2012: 79-82.
Meindl J D, Chen Q, Davis J A. Limits on silicon nanoelectronics for terascale integration[J]. Science, 2001, 293(5537): 2044-2049. DOI: 2044
Pang C, Wang Z, Ren X, et al. Electrical simulation of 3X3 TSV array with different signal and ground patterns[C]// Electronic Packaging Technology (ICEPT), 2013 14th International Conference on. Dalian: IEEE, 2013: 417-420.
Thorolfsson T, Gonsalves K, Franzon P D. Design automation for a 3DIC FFT processor for synthetic aperture radar: A case study[C]// Design Automation Conference46th ACM/IEEE. San Francisco, CA: IEEE, 2009: 51-56.
Zhao Y, Khursheed S, Al-Hashimi B M. Cost-effective TSV grouping for yield improvement of 3D-ICs[C]// 2012 IEEE 21st Asian Test Symposium IEEE. New Delhi: IEEE, 2011: 201-206.