Research on A Single-Event-Hardened Charge Pump[J]. 2017, 34(6): 14-17.
一款抗SET电荷泵研究[J]. 微电子学与计算机, 2017, 34(6): 14-17.DOI:
Research on A Single-Event-Hardened Charge Pump[J]. 2017, 34(6): 14-17.DOI:
一款抗SET电荷泵研究
摘要
提出了一种新颖的抗单粒子瞬变效应(SET)电荷泵结构
通过在电荷泵和低通滤波器间增加数控抑制电路(NCR)
对单粒子辐射产生的电流干扰脉冲进行实时抑制处理
降低电流脉冲的幅度和宽度
从而减少振荡器控制电压的波动
降低系统的抖动
采用130 nm CMOS工艺
与未加固电路对比
该电路可以降低电荷泵控制电流波动60%以上
注入电流处频率稳定度达到8e-4.
Abstract
A radiation-hardened charge pump has been proposed in which a novel numerical control restrain (NCR) circuit is applied to reduce the current perturbation and the clock jitter caused by the single energetic particle strikes. A hardened charge pump is implemented in a self-biased PLL with 130 nm CMOS process to verify the circuit and the corresponding results show that the peak of current perturbation reduces by up to 60% and the frequency stability reduces to 8e-4 compared with the traditional CP at the same time of current perturbation.