中国电子科技集团公司 第58研究所,江苏,无锡,214072
纸质出版:2016
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孙杰杰, 徐海铭, 胡小琴, 于跃, 袁同伟, 潘滨, 胡永强. 一种星用高可靠性MTM反熔丝PROM存储单元[J]. 微电子学与计算机, 2016, 33(12): 89-92.
SUN Jie-jie, XU Hai-ming, HU Xiao-qin, et al. A MTM Antifuse PROM Bitcell With a High Reliability for Satellite Use[J]. 2016, 33(12): 89-92.
提出了一种新型的
可用于卫星及其他航天器的高可靠性MTM反熔丝PROM存储单元
并围绕该存储单元
研究了其编程方式.实验表明
在PROM电路中采用该存储单元
且按照所述的编程方式
可以在编程过程中对未选中反熔丝实施有效保护
进而提高PROM芯片整体的可靠性和使用寿命.
In this paper
a novel MTM anti-fuse PROM bitcell with a high reliability is proposed
which can be used in stars and other spacecrafts. Based on this bitcell
programming and verification methods are studied. The use in PROM of the bitcell with the programming method described in this paper
can offer an effective protection to unselected anti-fuses in the programming process
therefore the reliability and working life of the PROM are improved.
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Shih C C, Lambertson R, Hawley F, et al. Characterization and modeling of a highly reliable metal-to-metal antifuse for high-performance and high-density field-programmable gate arrays[C]// Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International, Denver: IEEE, 1997: 25-33.
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