1. 北京大学 微电子学研究院,北京,100871
2. 北京大学 软件与微电子学院,北京,102600
3. 北京大学 (天津滨海)新一代信息技术研究院,天津,300450
纸质出版:2018
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黄一鸣, 冯建华, 张小飞. 一种改进的基于故障分析的逻辑加密算法[J]. 微电子学与计算机, 2018, 35(1): 1-5, 9.
HUANG Yi-ming, FENG Jian-hua, ZHANG Xiao-fei. An Improved Logic Encryption Algorithm Based on Fault Analysis[J]. 2018, 35(1): 1-5.
为了保护IC设计人员的知识产权
本文提出了一种改进的基于故障分析的逻辑加密算法
选择多路选择器作为密钥门电路
并根据其工作特性改善原有的故障分析算法.采用本方法加密后的电路与原电路输出相比可以实现更好的汉明距离.而且
与原故障分析方法相比
该方法只需采用更少的密钥门即可实现目标汉明距离.
In order to protect IC designerss intellectual property
In this paper
an improved insertion algorithm based on fault analysis was proposed. MUXes are chosen as the key gates and insertion method is improved based on its working property. This technique achieves better Hamming Distance between the correct and the wrong outputs. Furthermore
the target of the Hamming Distance is achieved using smaller number of key-gates compared to traditional method.
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