Single event upset is something when high energy particles hit the semiconductor device

it will cause the 10 transformation

and cause errors. In the harsh environment such as outer space

the chip will always be destroyed by SEU

the probability of this situation is higher since the larger scale of high performance of DSP. In view of SEU principle

anti radiation DSP will adopt a variety of reinforcement schemes. This article is based on the domestic high performance DSP HunXIn architecture

from the perspective of testability and engineering

puts forward the scheme of SRAM reinforcement on chip. Through the self-refresh and trip modular redundancy technology

SEU can be effectively suppressed.