TSVs串扰故障分组测试和诊断策略

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TSVs串扰故障分组测试和诊断策略

更新时间：2026-09-04

- TSVs串扰故障分组测试和诊断策略
- TSVs crosstalk fault grouping test and diagnostic strategy
- 微电子学与计算机 2020年37卷第2期页码：31-36
- 作者机构：
  
  1. 合肥工业大学计算机与信息学院,安徽,合肥,230009
  2. 合肥工业大学情感计算与先进智能机器安徽省重点实验室机构,安徽,合肥,230009
  3. 德岛大学工学院智能信息系，日本德岛 7708502
- 作者简介：
- 基金信息：
  
  国家自然科学基金 61432004国家自然科学基金 61306049国家自然科学基金 61474035
- DOI：
  中图分类号：
- 纸质出版：2020
- 稿件说明：
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王秀云, 刘军, 任福继. TSVs串扰故障分组测试和诊断策略[J]. 微电子学与计算机, 2020, 37(2): 31-36.

WANG Xiu-yun, LIU Jun, REN Fu-ji. TSVs crosstalk fault grouping test and diagnostic strategy[J]. 2020, 37(2): 31-36.
王秀云, 刘军, 任福继. TSVs串扰故障分组测试和诊断策略[J]. 微电子学与计算机, 2020, 37(2): 31-36. DOI：

WANG Xiu-yun, LIU Jun, REN Fu-ji. TSVs crosstalk fault grouping test and diagnostic strategy[J]. 2020, 37(2): 31-36. DOI：

摘要

TSVs串扰故障的测试和诊断对提高集成电路成品率有重要影响。为了减少TSVs测试和诊断时间，并且减少测试电路的面积开销，提出在信号接收端重用扫描单元的测试架构对TSVs串扰故障进行分组测试和诊断的新方案.该方案首先使用提出的TSVs分组算法，根据TSVs之间串扰影响距离，应用邻接矩阵求极大独立集对TSVs进行快速分组，使得每组内的TSVs不会发生串扰故障，并且最大化同组中TSVs的数量.分组完成后，使用提出的测试架构对同组内的TSVs进行并行测试，并且根据TSVs的测试响应，可以进一步诊断故障TSVs.实验结果表明，所提测试方案有效地减少了测试和诊断时间，并且减少了面积开销.

Abstract

Testing and diagnosis of TSVs crosstalk faults has an important impact on improving the yield of integrated circuits. In order to reduce TSVs testing and diagnostic time

and reduce the area overhead of the test circuit

a new scheme for group testing and diagnosis of TSVs crosstalk faults using a test architecture of the unilateral scan chain is proposed.The scheme firstly divides the TSVs into several groups according to the crosstalk influence distance between TSVs by the algorithm for finding the largest independent set in an adjacency matrix

so that the TSVs in each group do not have crosstalk faults and maximize TSVs in the same group.After grouping

the TSVs in the same group are tested and diagnosed in parallel using the proposed test architecture

and the faulty TSVs can be further diagnosed according to the test response of the TSVs. The experimental results show that the proposed test scheme effectively reduces the test and diagnosis time

and reduces the area overhead.

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references

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