基于SONOS型嵌入式flash存储器的扰动失效测试算法研究

乌勒; 刘武; 洪亮

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基于SONOS型嵌入式flash存储器的扰动失效测试算法研究

更新时间：2026-09-04

- 基于SONOS型嵌入式flash存储器的扰动失效测试算法研究
- Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory
- 微电子学与计算机 2021年38卷第5期页码：7-13
- 作者机构：
  
  1. 上海交通大学微米/纳米加工技术国家级重点实验室,上海,200240
  2. 上海交通大学电子信息与电气工程学院微纳电子学系,上海,200240
  3. 上海华力微电子有限公司,上海,201314
- 作者简介：
- 基金信息：
  
  上海市科委专业技术服务平台 19DZ2291103
- DOI：
  中图分类号：
- 纸质出版：2021
- 稿件说明：
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乌勒, 刘武, 洪亮. 基于SONOS型嵌入式flash存储器的扰动失效测试算法研究[J]. 微电子学与计算机, 2021, 38(5): 7-13.

WU Le, LIU Wu, HONG Liang. Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory[J]. 2021, 38(5): 7-13.
乌勒, 刘武, 洪亮. 基于SONOS型嵌入式flash存储器的扰动失效测试算法研究[J]. 微电子学与计算机, 2021, 38(5): 7-13. DOI：

WU Le, LIU Wu, HONG Liang. Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory[J]. 2021, 38(5): 7-13. DOI：

摘要

目前flash扰动失效测试算法无法检测SONOS型flash存储器的全部扰动失效，特别是对读扰动失效检测的失效覆盖率低，且测试效率不高.针对这一问题，本文对March-FT测试算法进行扩展和优化，提出了一种用于检测SONOS型flash存储器的扰动失效测试算法——March-SONOS.结合算法评估系统验证，March-SONOS测试算法可检测SONOS型flash存储器的全部扰动失效，且失效覆盖率达到100%，同时算法测试效率提高55.97%.

Abstract

The current Flash disturbance failure test algorithm cannot detect all the disturbance failures of SONOS-type Flash memory

especially the failure coverage of read disturbance failure test is low

and the test efficiency is poor. To solve this problem

this paper extends and optimises the March-FT test algorithm

and put forward the March-SONOS test algorithm

which is used to detect the disturbance failure test algorithm of SONOS-type Flash memory.Combined with the verification of the algorithm evaluation system

the March_SONOS test algorithm can detect all disturbance failures of SONOS-style Flash memory

and the failure coverage rate reaches 100%. Meanwhile

the algorithm test and test efficiency is improved by 55.97%.

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references

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