One of the major challenges in testing a system-on-a-chip is dealing with a large volume of test data.To reduce the volume of test data

dual-run-length code is proposed in this paper

a variable-to-variable run-length code based on encoding both runs of 0s and 1s.Both runs of 0s and 1s are considered in this method so as to reduce the number of short runs

and the circuit structure of decoder with FSM is proposed.Theoretical analysis and experimental results show that this schemes is a very efficient compress...